TITLE

Graded ferroelectric thin films: Possible origin of the shift along the polarization axis

AUTHOR(S)
Poullain, G.; Bouregba, R.; Vilquin, B.; Le Rhun, G.; Murray, H.
PUB. DATE
December 2002
SOURCE
Applied Physics Letters;12/23/2002, Vol. 81 Issue 26, p5015
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Hysteresis measurements performed on graded Pt/lead zirconate titanate (PZT)/Pt structures with well oxygenated PZT films do not display any shift along the polarization axis (V[sub offset]) as previously reported. On the other hand, when the PZT graded films were grown under low oxygen pressure, an offset voltage was measured. This shift was systematically enhanced after cycling the film as for fatigue measurements. It was also observed that the V[sub offset] is independent of the value of the reference capacitor used in the Sawyer-Tower circuit. We propose an asymmetry in the leakage current of the structure to be at the origin of the shift along the polarization axis.
ACCESSION #
8691531

 

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