Charge imaging and manipulation using carbon nanotube probes

Tzeng, S.-D.; Wu, C.-L.; You, Y.-C.; Chen, T. T.; Gwo, S.; Tokumoto, H.
December 2002
Applied Physics Letters;12/23/2002, Vol. 81 Issue 26, p5042
Academic Journal
Due to their high aspect ratio, well-defined cylindrical structure, and good electrical conductivity, carbon nanotubes (CNTs) are ideal probes for "true" local imaging of electric domain structures at the nanoscale. By performing force-distance measurements and tip-shape profiling with a uniformly charged oxide square, we clearly demonstrate the local nature of the CNT tip for electrostatic force microscopy. We show that CNTs can be used to probe long-range electrostatic forces with a lateral resolution better than 5 nm.


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