TITLE

Direct imaging of submicron-scale defect-induced birefringence in SrTiO3 bicrystals

AUTHOR(S)
McDaniel, E.B.; Hsu, J.W.P.
PUB. DATE
July 1998
SOURCE
Journal of Applied Physics;7/1/1998, Vol. 84 Issue 1, p189
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents information on the mapping of the anistropic strain fields associated with individual submicron defects, through the use of the near-field scanning optical microscope capable of quantitative polarimetry. Exhibition of many defects; Assistance of direct observation of these defect-induced strain fields; Consistency of bicrystals.
ACCESSION #
867722

 

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