Far-field free tapping-mode tip-enhanced Raman microscopy

Yu, Jun; Saito, Yuika; Ichimura, Taro; Kawata, Satoshi; Verma, Prabhat
March 2013
Applied Physics Letters;3/25/2013, Vol. 102 Issue 12, p123110
Academic Journal
A tip-enhanced Raman scattering (TERS) microscope has been developed, which is based on the tapping-mode operation of atomic force microscopy. By synchronizing a multichannel detector with tapping oscillation of the metallic nanotip, one can measure a tip-sample separation dependent TERS spectrum and dynamically obtain both near- and far-field Raman signals during the periodic oscillation of the tip. This facilitates TERS imaging with in situ point-by-point removal of far-field background, resulting in higher contrast in TERS imaging. Furthermore, we can obtain an extremely high spatial resolution of 8 nm. Also, tapping mode operation of tip has an added advantage of low sample damage, which could be important for future application of TERS to soft biological materials. Our TERS imaging technique enables us to construct far-field-free high-contrast near-field image at faster imaging speed with extremely high spatial resolution.


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