Si-based omnidirectional reflector and transmission filter optimized at a wavelength of 1.55 μm

Lee, Hyun-Yong; Makino, Hisao; Yao, Takafumi; Tanaka, Akinori
December 2002
Applied Physics Letters;12/9/2002, Vol. 81 Issue 24, p4502
Academic Journal
Omnidirectional (omni-) reflector and transmission filter optimized at a wavelength of 1.55 µm have been realized using Si/SiO[sub 2] one-dimensional photonic crystals (1D PCs). Photonic band structures in the PCs with and without a defect layer have been also analyzed. The 1D PCs fabricated have very large omnidirectional photonic band gaps (omni-PBGs), and their measured reflectance spectra are in very good agreement with the calculated results. The omni-PBG in a six-pair Si/SiO[sub 2] 1D PC (no defect layer, a filling factor η=0.406) exists in a normalized frequency range of 0.223-0.297. Introducing a defect layer generates a defect state in the PBG, and it behaves like electronic impurity levels in the gap with a change in thickness of the defect layer (d[sub D]). A six-pair Si/SiO[sub 2] 1D PC with the structure parameters of η=4.060, d[sub H] (Si thickness)=95.3 nm, d[sub L] (SiO[sub 2] thickness)=234.9 nm, and d[sub D] = 2.336·d[sub H] could act as a 1.55 µm-transmission filter for normal incidence light.


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