TITLE

Thermal spike analysis of interface mixing induced by swift heavy ions

AUTHOR(S)
Szenes, G.
PUB. DATE
December 2002
SOURCE
Applied Physics Letters;12/9/2002, Vol. 81 Issue 24, p4622
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Interface mixing induced by energetic ions is discussed, applying the author's thermal spike model. Diffusion in the ion-induced melt is assumed. An expression is derived for the variation of the mixing rate k with the electronic stopping power S[sub e]. The experimental results recently reported by the Stuttgart group on NiO, ZnO, CuO, and Cu[sub 2]O layers on SiO[sub 2] substrate are analyzed and good agreement is found with the predictions of the model for k and for the threshold of S[sub e] for melt formation. Average diffusion coefficients in the spike are estimated, and D[sub d]≈0.053, 0.03, and 0.004 cm²/s are obtained for Zn, Ni, and Cu ions, respectively.
ACCESSION #
8633254

 

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