TITLE

Fractal analysis of the surface of indium--tin-oxide

AUTHOR(S)
Hosseinpanahi, F.; Raoufi, D.
PUB. DATE
September 2012
SOURCE
Iranian Journal of Physics Research;Fall2012, Vol. 12 Issue 3, p74
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
In this study, indium-tin-oxide thin films in different thickness ranges were prepared by electron beam evaporation method on the glass substrate at room temperature. The thicknesses of films were 100, 150 and 250nm. Using fractal analysis, morphological characteristics of surface films thickness in amorphous state were investigated. The results showed that by increasing thickness, surface roughness (RMS) and lateral correlation length (ξ) were decreased. Also, the roughness exponent a and growth exponent ß were determined to be 0.72±0.01 and 0.11, respectively. Based on these results, we understand that the growth films can be described by the combination of the Edwards-Wilkinson equation and Mullins diffusion equation.
ACCESSION #
85726236

 

Related Articles

  • Surface Morphology Dynamics in ITO Thin Films. Raoufi, Davood; Hosseinpanahi, Faegh // Journal of Modern Physics (21531196);Aug2012, Vol. 3 Issue 8, p645 

    In this study, indium tin oxide (ITO) thin films were prepared by electron beam evaporation method on float glass substrates at room temperature (RT). The surface morphology and dynamic scaling behavior of the films were studied by atomic force microscopy (AFM). It was found that average surface...

  • Correlation between microstructure and electrical, optical properties of thermal annealed ITO thin films. Xu, Zhou; Chen, Peng; Wu, Zhenlong; Xu, Feng; Yang, Guofeng; Liu, Bin; Tan, Chongbin; Xu, Zhaoqing; Zhang, Lin; Zhang, Rong; Zheng, Youdou // Journal of Materials Science: Materials in Electronics;May2014, Vol. 25 Issue 5, p2287 

    Indium tin oxide (ITO) thin films with the thickness of 300 nm were deposited on quartz substrates via electron beam evaporation. Five samples were post-annealed in air atmosphere for 10 min at five selected temperature points from 200 to 600 °C, respectively. X-ray diffractometer, Hall...

  • Use of double-layer ITO films in reflective contacts for blue and near-UV LEDs. Markov, L.; Smirnova, I.; Pavluchenko, A.; Kukushkin, M.; Zakheim, D.; Pavlov, S. // Semiconductors;Dec2014, Vol. 48 Issue 12, p1674 

    The structural and optical properties of multilayer ITO/SiO/Ag composites are studied. In these composites, the ITO (indium-tin oxide) layer is produced by two different methods: electron-beam evaporation and a combined method including electron-beam evaporation and subsequent magnetron...

  • The effect of substrate temperature on the microstructural, electrical and optical properties of Sn-doped indium oxide thin films. Raoufi, Davood; Taherniya, Atefeh // European Physical Journal - Applied Physics;Jun2015, Vol. 70 Issue 3, p30302-p1 

    In this work, Sn doping In2O3 (ITO) thin films with a thickness of 200 nm were deposited on glass substrates by electron beam evaporation (EBE) method at different substrate temperatures. The crystal structure of these films was studied by X-ray diffraction technique. The sheet resistance was...

  • Journal of the Americal Chemical Society: Chemists advance clear conductive thin films.  // Biomedical Market Newsletter;8/1/2012, Vol. 21, p1 

    The article informs that the researchers from Brown University in Providence, Rhode Island have developed a solution-based chemistry which makes the manufacturing of indium tin oxide films cheaper.

  • Optimization of the deposition technique of thin ITO films used as transparent conducting contacts for blue and near-UV LEDs. Smirnova, I.; Markov, L.; Pavlyuchenko, A.; Kukushkin, M.; Pavlov, S. // Semiconductors;Jan2014, Vol. 48 Issue 1, p58 

    Structural, optical, and electrical properties of indium-tin oxide (ITO) films produced by electron-beam evaporation, magnetron sputtering, and a combined method are studied. It is demonstrated that, despite the high transparency of the electron-beam-deposited ITO films in the visible spectral...

  • 1/f noise in micrometer-sized ultrathin indium tin oxide films. Yeh, Sheng-Shiuan; Hsu, Wei-Ming; Lee, Jui-Kan; Lee, Yao-Jen; Lin, Juhn-Jong // Applied Physics Letters;9/16/2013, Vol. 103 Issue 12, p123118 

    We have measured the low-frequency noises of ultrathin indium tin oxide films to investigate the effect of post annealing on the noise level. The noises obtained obey an approximate 1/f law in the frequency range f ≈ 0.1-20 Hz. The microstructures and grain sizes of our films were altered...

  • Growth of pure and doped ZnO thin films for solar cell applications. Sathya, M.; Claude, A.; Govindasamy, P.; Sudha, K. // Advances in Applied Science Research;Oct2012, Vol. 3 Issue 5, p2591 

    Thin films form a fair share in the ever growing solar cell research and also in the market. One of the most versatile materials grown as thin films today are from derivatives of pure and doped Zinc Oxide. A combination of dip coating and electrodeposition is a powerful tool in order to achieve...

  • Reversible superconductivity in electrochromic indium-tin oxide films. Aliev, Ali E.; Xiong, Ka; Cho, Kyeongjae; Salamon, M. B. // Applied Physics Letters;12/17/2012, Vol. 101 Issue 25, p252603 

    Transparent conductive indium tin oxide (ITO) thin films, electrochemically intercalated with sodium or other cations, show tunable superconducting transitions with a maximum Tc at 5 K. The transition temperature and the density of states, D(EF) (extracted from the measured Pauli susceptibility...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics