TITLE

Parametrical study of flaw detection in polycrystalline materials by reducing the multiple scattering contribution

AUTHOR(S)
Shahjahan, S.; Aubry, A.; Rupin, F.; Chassignole, B.; Derode, A.
PUB. DATE
January 2013
SOURCE
AIP Conference Proceedings;Jan2013, Vol. 1511 Issue 1, p675
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Ultrasonic non destructive testing of coarse-grain materials can be hampered by backscattered noise. Recent laboratory studies on synthetic samples have shown that the contribution of single scattering could be separated from multiple scattering, by means of phased array acquisitions, based on random matrices properties combined with the DORT imaging method. This novel method is applied to an industrial material, a nickel-based alloy sample with various manufactured flaws, in the 3-5 MHz range. Experimental results show that flaw detection is then significantly increased compared to classical techniques.
ACCESSION #
85094241

 

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