New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope

Mugele, F.; Rettenberger, A.; Boneberg, J.; Leiderer, P.
April 1998
Review of Scientific Instruments;Apr98, Vol. 69 Issue 4, p1765
Academic Journal
Presents the design of variable-temperature ultrahigh vacuum (UHV) scanning tunneling microscope. Performance of the instrument; Components of the UHV system; Measurement of WSe[sub 2] illumination at variable temperatures.


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