TITLE

Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum

AUTHOR(S)
Lantz, M. A.; Lantz, M.A.; O'Shea, S. J.; O'Shea, S.J.; Welland, M. E.; Welland, M.E.
PUB. DATE
April 1998
SOURCE
Review of Scientific Instruments;Apr98, Vol. 69 Issue 4, p1757
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Characterizes metal coated and semiconductor tips for conducting atomic force microscopy in ultrahigh vacuum. Reliability of various tips; Application of scanning transmission electron microscopy; Relation between contamination tip and tip-sample adhesion.
ACCESSION #
835688

 

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