TITLE

A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope

AUTHOR(S)
Wurtz, G.; Bachelot, R.; Royer, P.
PUB. DATE
April 1998
SOURCE
Review of Scientific Instruments;Apr98, Vol. 69 Issue 4, p1735
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Develops a polyvalent reflection-mode apertureless scanning near-field optical microscope (SNOM) from a commercial scanning probe microscope. Description of the SNOM device; Types of reflection mode SNOM configurations; Types of SNOM probes.
ACCESSION #
835684

 

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