A two-inch dc/rf circular magnetron sputtering gun for a miniature chamber for an in situ experiment
Tags: SPUTTERING (Physics); ELECTRON gun; REFLECTANCE
Related Articles
- In situ monitoring of ion sputtering and thermal annealing of crystalline surfaces using an oblique-incidence optical reflectance difference method. Zhu, X. D.; Nabighian, E. // Applied Physics Letters;11/9/98, Vol. 73 Issue 19
We demonstrate that the morphology of crystalline surfaces during ion sputtering and thermal annealing can be monitored in situ with an oblique-incidence polarization-modulated optical reflectance difference technique. Such a technique is effective under high ambient pressures as well as...
- Extreme ultraviolet broadband Mo/Y multilayer analyzers. Wang, Zhanshan; Wang, Hongchang; Zhu, Jingtao; Xu, Yao; Zhang, Shumin; Li, Cunxia; Wang, Fengli; Zhang, Zhong; Wu, Yongrong; Cheng, Xinbin; Chen, Lingyan; Michette, Alan G.; Pfauntsch, Slawka J.; Powell, A. Keith; Sch�fers, Franz; Gaupp, Andreas; MacDonald, Mike // Applied Physics Letters;12/11/2006, Vol. 89 Issue 24, p241120
Broadband extreme ultraviolet molybdenum/yttrium aperiodic multilayer analyzers were designed for polarization experiments in 8.5�11.7 nm wavelength range. The multilayer analyzers were made using direct current magnetron sputtering and characterized using the soft x-ray polarimeter at...
- X-ray reflectivity measurements of the expansion of carbon films upon annealing. Lucas, C.A.; Nguyen, T.D.; Kortright, J.B. // Applied Physics Letters;10/21/1991, Vol. 59 Issue 17, p2100
Measures the x-ray reflectivity of amorphous carbon films upon thermal annealing. Correlation between film thickness and density; Association of interatomic bonding with graphitic microstructure transition; Preparation of films by direct current magnetron sputtering.
- Novel and nonintrusive optical thermometer. Guidotti, Daniel; Wilman, John G. // Applied Physics Letters;2/3/1992, Vol. 60 Issue 5, p524
Develops an optical beam thermometer (OBT) based on temperature-induced changes in optical reflectivity of metals and semiconductors. Construction of a null-point optical bridge; Estimation of OBT shot noise limit sensitivity; Comparison of OBT and Luxtron thermo-fluorescence temperature on...
- High-brightness and high-resolution RHEED system. van Gorkum, A. A.; Smits, M. R. T.; Larsen, P. K.; Raue, R. // Review of Scientific Instruments;Sep89, Vol. 60 Issue 9, p2940
A RHEED system, consisting of a high-resolution (75-�m FWHM) and high-brightness (10�A) electron gun, and a phosphor screen with high resolution and gored linearity, was developed. The system is based on concepts from projection television. The results show that this setup is particularly...
- Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers. Maury, H.; Jonnard, P.; Le Guen, K.; Andr�, J.-M.; Wang, Z.; Zhu, J.; Dong, J.; Zhang, Z.; Bridou, F.; Delmotte, F.; Hecquet, C.; Mahne, N.; Giglia, A.; Nannarone, S. // European Physical Journal B -- Condensed Matter;Jul2008, Vol. 64 Issue 2, p193
The interplay between optical performance and the thermally activated interface chemistry of periodic Mg/SiC multilayers designed for application at 30.4 nm are investigated by optical (hard X-ray, soft X-ray and ultraviolet ranges, i.e. from 0.154 to 30.4 nm) reflectivity and X-ray emission...
- Characterization and optimization of magnetron sputtered Sc/Si multilayers for extreme ultraviolet optics. Gautier, J.; Delmotte, F.; Bridou, F.; Ravet, M.F.; Varniere, F.; Roulliay, M.; Jerome, A.; Vickridge, I. // Applied Physics A: Materials Science & Processing;Sep2007, Vol. 88 Issue 4, p719
Scandium/silicon multilayers have been deposited by magnetron sputtering and characterized by several techniques. Experimental peak reflectances of 0.22 and 0.37 have been measured respectively at wavelengths of 40 nm and 46 nm, for 10� incidence angle. The corresponding theoretical values for...
- Nanoscale structural change in a sputter-deposited SiO[sub 2]/a-Si/SiO[sub 2] sandwich. Li, B. Q.; Xu, W. T.; Fujimoto, T. T.; Kojima, I. // Journal of Applied Physics;2/1/2004, Vol. 95 Issue 3, p1600
We report direct evidence that annealing a sputter-deposited SiO[sub 2]/a-Si/SiO[sub 2] sandwiched structure on Si(100) results in the Si layer to expand. X-ray reflectivity (XRR) revealed the thickness of the Si layer to be temperature-dependent. Auger depth profiling (ADP) detected marked...
- Elimination of total internal reflection in GaInN light-emitting diodes by graded-refractive-index micropillars. Kim, Jong Kyu; Noemaun, Ahmed N.; Mont, Frank W.; Meyaard, David; Schubert, E. Fred; Poxson, David J.; Kim, Hyunsoo; Sone, Cheolsoo; Park, Yongjo // Applied Physics Letters;12/1/2008, Vol. 93 Issue 22, p221111
A method for enhancing the light-extraction efficiency of GaInN light-emitting diodes (LEDs) by complete elimination of total internal reflection is reported. Analytical calculations show that GaInN LEDs with multilayer graded-refractive-index pillars, in which the thickness and refractive index...


