The time-of-flight experiment and the average transit-time

Rocha, Rodrigo P.; Freire, José A.
October 2012
Journal of Applied Physics;Oct2012, Vol. 112 Issue 8, p083717
Academic Journal
The time-of-flight experiment is a transient photo-current measurement commonly used to measure the mobility of organic semiconductors. The experiment has a well established procedure to extract the average transit-time of the photo-generated carriers across the sample from the current versus time signal. In this work, we compare, for a dispersive signal, the transit-time as inferred from the experimental procedure with the statistically defined average transit-time. We show that the two quantities are not only numerically different, the experimental transit-time being always smaller than the exact one, but they also have markedly different electric field and sample length dependencies. Our results are relevant for any attempt to model an experimental time-of-flight mobility.


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