TITLE

Depth profile study of ferroelectric PbZr[sub 0.2]Ti[sub 0.8]O[sub 3] films

AUTHOR(S)
Li, Y.; Nagarajan, V.; Aggarwal, S.; Ramesh, R.; Salamanca-Riba, L. G.; Martınez-Miranda, L. J.
PUB. DATE
December 2002
SOURCE
Journal of Applied Physics;12/1/2002, Vol. 92 Issue 11, p6762
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have performed depth profile studies of the structure of PbZr[sub 0.2]Ti[sub 0.8]O[sub 3] films of different thicknesses deposited on SrTiO[sub 3] substrates prepared by pulsed laser deposition, using grazing incident x-ray scattering (GIXS). The in-plane structure of the films reveals these consist of up to three domains, one c-axis domain, and two a-axis domains, denoted al and a2. GIXS measurements show the evolution of in-plane compression of the lattice parameter as a function of depth within the films, particularly in the a1 domains. This strain evolution is accompanied by the presence of twist grain boundaries in the plane in some films. The measured in-plane lattice parameters are asymmetric, which suggests an orthorhombic distortion of the lattice in the plane of the films.
ACCESSION #
7903522

 

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