TITLE

F 1 s core level spectra of fluorinated multiwalled carbon nanotubes

AUTHOR(S)
Baitinger, E.; Brzhezinskaya, M.; Voinkova, I.; Vekesser, N.; Kovalev, I.; Viktorov, V.
PUB. DATE
August 2012
SOURCE
Inorganic Materials;Aug2012, Vol. 48 Issue 8, p803
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
This paper presents results of modeling the shape of the satellites of the F 1 s line in the X-ray photoelectron spectra of fluorinated multiwalled carbon nanotubes using the semiempirical quasi-molecular large unit cell method. The modeling results adequately describe the key features of the shape of the satellite F 1 s spectra, in particular, the additive contributions to the F 1 s satellites from several graphite-like layers of nanotubes containing different amounts of attached fluorine.
ACCESSION #
77735756

 

Related Articles

  • X-ray photoelectron spectroscopic study of Ge2Sb2Te5 etched by fluorocarbon inductively coupled plasmas. Kang, S.-K.; Oh, J. S.; Park, B. J.; Kim, S. W.; Lim, J. T.; Yeom, G. Y.; Kang, C. J.; Min, G. J. // Applied Physics Letters;7/28/2008, Vol. 93 Issue 4, p043126 

    X-ray photoelectron spectroscopy was used to determine the level of surface fluorination damage of Ge2Sb2Te5 (GST) etched by fluorocarbon gases at different F/C ratios. When blank GST was etched, the gas with a higher F/C ratio produced a thinner C–F polymer on the etched surface but...

  • Determining concentration depth profiles in fluorinated networks by means of electric force microscopy. Miccio, Luis A.; Kummali, Mohammed M.; Montemartini, Pablo E.; Oyanguren, Patricia A.; Schwartz, Gustavo A.; Alegría, Ángel; Colmenero, Juan // Journal of Chemical Physics;8/14/2011, Vol. 135 Issue 6, p064704 

    By means of electric force microscopy, composition depth profiles were measured with nanometric resolution for a series of fluorinated networks. By mapping the dielectric permittivity along a line going from the surface to the bulk, we were able to experimentally access to the fluorine...

  • X-ray photoelectron spectroscopy study of intercalated compounds of fluorinated graphite C2FxBr0.01� yCH3CN. Aseeva, E.; Pinakov, D.; Oglezneva, I.; Chekhova, G.; Mazalov, L.; Shubin, Yu. // Journal of Structural Chemistry;Sep2006, Vol. 47 Issue 5, p930 

    The energy level structure of fluorinated graphite intercalation compounds C2FxBr0.01� yCH3CN ( x = 0.49�0.87, y = 0.084�0.136) has been studied by X-ray photoelectron spectroscopy providing the information on the electronic structure of compounds in question. The analysis of...

  • Composition of Fluoridated Dental Enamel Studied by X-ray Photoelectron Spectroscopy (ESCA). HERCULES, DAVID M.; CRAIG, NORMAN L. // Journal of Dental Research;Sep1976, Vol. 55 Issue 5, p829 

    Enamel surfaces that had been treated with an acid phosphate-fluoride gel were analyzed for phosphorus, calcium, fluorine, and carbon using X-ray photoelectron spectroscopy. This technique revealed a heavy carbon coating on the enamel that overlays a surface composed of a 1:2 ratio of calcium to...

  • Fluorine and Tin Uptake by Enamel Studied by X-Ray Photoelectron Spectroscopy (ESCA). HERCULES, DAVID M.; CRAIG, NORMAN L. // Journal of Dental Research;Feb1978, Vol. 57 Issue 2, p296 

    ESCA has been combined with argon-ion etching to obtain depth profiles for SnF2-treated enamel. Three zones of products from the topical treatment are detected: a layer of tin oxide on the surface; fluoroapatite + hydroxyapatite at depths below about 0.2 micron; an intermediate layer CaF2,...

  • Formation of anodic layers on InAs (111)III. Study of the chemical composition. Valisheva, N.; Tereshchenko, O.; Prosvirin, I.; Kalinkin, A.; Goljashov, V.; Levtzova, T.; Bukhtiyarov, V. // Semiconductors;Apr2012, Vol. 46 Issue 4, p552 

    The chemical composition of ∼20-nm-thick anodic layers grown on InAs (111)III in alkaline and acid electrolytes containing or not containing NHF is studied by X-ray photoelectron spectroscopy. It is shown that the composition of fluorinated layers is controlled by the relation between the...

  • Coating of metal implant materials with strontium. Frank, Matthias; Walter, Martin; Tiainen, Hanna; Rubert, Marina; Monjo, Marta; Lyngstadaas, S.; Haugen, Håvard // Journal of Materials Science: Materials in Medicine;Nov2013, Vol. 24 Issue 11, p2537 

    The aim of this study was to show that cathodic polarization can be used for coating commercial implant surfaces with an immobilized but functional and bioavailable surface layer of strontium (Sr). Moreover, this study assessed the effect of fluorine on Sr-attachment. X-ray photoelectron...

  • Effects of fluorine incorporation into HfO2 gate dielectrics on InP and In0.53Ga0.47As metal-oxide-semiconductor field-effect-transistors. Yen-Ting Chen; Han Zhao; Yanzhen Wang; Fei Xue; Fei Zhou; Lee, Jack C. // Applied Physics Letters;6/21/2010, Vol. 96 Issue 25, p253502 

    In this work, the effects of fluorine (F) incorporation on electrical characteristics of HfO2/InP and HfO2/In0.53Ga0.47As gate stack are presented. F had been introduced into HfO2 gate dielectric by postgate CF4 plasma treatment, which was confirmed by x-ray photoelectron spectroscopy analysis...

  • Physicochemical characterization of point defects in fluorine doped tin oxide films. Akkad, Fikry El; Joseph, Sudeep // Journal of Applied Physics;7/15/2012, Vol. 112 Issue 2, p023501 

    The physical and chemical properties of spray deposited FTO films are studied using FESEM, x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS), electrical and optical measurements. The results of XRD measurements showed that the films are polycrystalline (grain size 20-50 nm) with...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics