TITLE

Scanning tunneling microscopy on rough surfaces: Tip-shape-limited resolution

AUTHOR(S)
Reiss, G.; Vancea, J.; Wittmann, H.; Zweck, J.; Hoffmann, H.
PUB. DATE
February 1990
SOURCE
Journal of Applied Physics;2/1/1990, Vol. 67 Issue 3, p1156
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents a study that discussed the reliability of scanning tunneling microscopy (STM) images of rough surfaces of polycrystalline thin films. Details of the etching procedure; Estimation of the tip shape of the rough surfaces; Comparison of the images from STM and transmission electron microscopy.
ACCESSION #
7667923

 

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