TITLE

Structural investigation of the titanium/diamond film interface

AUTHOR(S)
Terranova, M. L.; Rossi, M.; Vitali, G.
PUB. DATE
September 1996
SOURCE
Journal of Applied Physics;9/15/1996, Vol. 80 Issue 6, p3552
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Deals with a study which investigated the structure of the transition layers formed at the interface between titanium substrate and diamond films, using the reflection high-energy electron diffraction (RHEED) technique. Information on the RHEED technique; Methodology of the study; Results and discussion.
ACCESSION #
7664019

 

Related Articles

  • Synthetic diamond electrodes: The effect of surface microroughnesson the electrochemical properties of CVD diamond thin films on titanium. Pleskov, Yu.; Evstefeeva, Yu.; Krotova, M.; Lim, P.; Shih, H.; Varnin, V.; Teremetskaya, I.; Vlasov, I.; Ralchenko, V. // Journal of Applied Electrochemistry;Sep2005, Vol. 35 Issue 9, p857 

    The electrochemical behavior of B-doped diamond films on Ti substrates subjected to different pretreatment procedures (annealing, sand-blasting, and etching in HCl) is evaluated as a function of surface microroughness. Generally, the differential capacitance follows the true surface area of the...

  • Homoepitaxial growth of diamond by an advanced hot-filament chemical vapor deposition method. Kondoh, Eiichi; Tanaka, Kenji; Ohta, Tomohiro // Journal of Applied Physics;8/1/1993, Vol. 74 Issue 3, p2030 

    Addresses the conditions for the epitaxial growth of diamond films grown by an advanced hot-filament chemical vapor deposition method. Application of optical microscopy and reflection high energy electron diffraction; Overview of the surface morphology of the films; Gas-phase chemistry for the...

  • Investigations on the nature of observed ferromagnetism and possible spin polarization in Co-doped anatase TiO[sub 2] thin films. Kim, D. H.; Yang, J. S.; Lee, K. W.; Bu, S. D.; Kim, D.-W.; Noh, T. W.; Oh, S.-J.; Kim, Y.-W.; Chung, J.-S.; Tanaka, H.; Lee, H. Y.; Kawai, T.; Won, J. Y.; Park, S. H.; Lee, J. C. // Journal of Applied Physics;5/15/2003, Vol. 93 Issue 10, p6125 

    High-quality epitaxial thin films of Co-doped anatase TiO[SUB2] (Co:TiO2[SUB2) were grown epitaxially on SrTiO[SUB3] (001) substrates by using pulsed laser deposition with in-situ reflection high-energy electron diffraction. The oxygen partial pressure, P[SUBO2], during the growth was...

  • In situ thin-film texture determination. Litminov, Dmitri; O'Donnell, Thomas // Journal of Applied Physics;2/15/1999, Vol. 85 Issue 4, p2151 

    Presents information on a kinematic theory of reflection high energy electron diffraction (RHEED) for textured polycrystalline thin films. Analysis and discussion; Conclusions.

  • UV detectors based on epitaxial diamond films grown on single-crystal diamond substrates by vapor-phase synthesis. Sharonov, G.; Bolshakov, A.; Ralchenko, V.; Kazuchits, N.; Petrov, S. // Journal of Applied Spectroscopy;Nov2010, Vol. 77 Issue 5, p658 

    The prospects for use of CVD-technology for epitaxial growth of single-crystal diamond films of instrumental quality in UHF plasma for the production of optoelectronic devices are discussed. A technology for processing diamond single crystals that provides a perfect surface crystal structure...

  • Structure and morphology of nano-sizedW--Ti/Si thin films. Petrović, Suzana M.; Adnadjević, Borivoje; Peruško, Davor; Popović, Nada; Bundaleski, Nenad; Radović, Milan; Gaković, Biljana; Rakočević, Zlatko // Journal of the Serbian Chemical Society;Aug/Sep2006, Vol. 71 Issue 8/9, p969 

    Thin films were deposited by d.c. sputtering onto a silicon substrate. The influence of the W Ti thin film thickness to its structural and morphological characteristics of a nano-scale were studied. The phase composition and grain size were studied by X-ray diffraction (XRD), while the surface...

  • The interfacial properties of MgCl2 thin films grown on Ti(0001). Karakalos, S.; Siokou, A.; Sutara, F.; Skala, T.; Vitaliy, F.; Ladas, S.; Prince, K.; Matolin, V.; Chab, V. // Journal of Chemical Physics;8/21/2010, Vol. 133 Issue 7, p074701 

    Photoelectron spectroscopy with synchrotron radiation (SRPES), temperature programmed desorption (TPD), low energy electron diffraction (LEED), and ion-scattering spectroscopy (ISS) were used in order to study the MgCl2/Ti(0001) interface. A clear hexagonal LEED pattern confirmed the presence of...

  • Cation stoichiometry optimization of SrTiO3 (110) thin films with atomic precision in homogeneous molecular beam epitaxy. Wang, Zhiming; Feng, Jiagui; Yang, Yang; Yao, Yuan; Gu, Lin; Yang, Fang; Guo, Qinlin; Guo, Jiandong // Applied Physics Letters;1/30/2012, Vol. 100 Issue 5, p051602 

    We study the evolution of surface reconstructions on SrTiO3 (110) determined by cation concentration ratio and find it detectable by high energy electron diffraction (RHEED) even at high temperature up to 800 °C. The evaporation rate of Sr and Ti sources can be calibrated precisely by...

  • In situ electrical conductivity and amorphous-crystalline transition in vacuum-deposited amorphous thin films of a Se50Te50 alloy. Damodara Das, V.; Jansi Lakshmi, P. // Journal of Applied Physics;9/15/1987, Vol. 62 Issue 6, p2376 

    Presents a study which showed in situ electrical conductivity measurements on vacuum-deposited amorphous thin films of various thicknesses of a Se[sub50]Te[sub50] alloy in the temperature range 300-430K. Preparation of the bulk polycrystalline alloy; Determination of the thicknesses of the...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics