TITLE

Optoelectronic characterization by photothermal deflection: Single-crystalline semiconductors

AUTHOR(S)
Grunow, P.; Kunst, M.
PUB. DATE
March 1995
SOURCE
Journal of Applied Physics;3/15/1995, Vol. 77 Issue 6, p2767
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the use of the photothermal deflection (PD) technique for the characterization of semiconductors by measurements on crystalline silicon and CdS. Configuration for PD inside a semiconductor; Information on the PD signal measured for different surface preparations.
ACCESSION #
7662773

 

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