Transmission electron microscopy and cathodoluminescence of tensile-strained GaxIn1-xP/InP heterostructures. II. On the origin of luminescence heterogeneities in tensile stress relaxed GaxIn1-xP/InP heterostructures

Cléton, F.; Sieber, B.; Bensaada, A.; Masut, R. A.; Bonard, J. M.; Ganière, J. D.
July 1996
Journal of Applied Physics;7/15/1996, Vol. 80 Issue 2, p837
Academic Journal
Deals with a study which determined the origin of the spatial luminescence fluctuations observed between the dark line defects present in tensile strained Ga[subx]In[1-x]P/In/n-InP heterostructures. Experimental details; Beam energy experiments; Conclusion.


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