Parametric tip model and force–distance relation for Hamaker constant determination from atomic force microscopy

Argento, C.; French, R. H.
December 1996
Journal of Applied Physics;12/1/1996, Vol. 80 Issue 11, p6081
Academic Journal
Presents a study which measured the hamaker constants and dispersion forces interactions of materials of increasing interest and the advent of atomic force microscopy. Integration of the interaction force; Approach in surface formulation; Development of a parametric model for a probe.


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