TITLE

Surface mobility of C60 on SiO2

AUTHOR(S)
Moalem, M.; Balooch, M.; Hamza, A. V.; Siekhaus, W. J.; Olander, D. R.
PUB. DATE
September 1993
SOURCE
Journal of Chemical Physics;9/15/1993, Vol. 99 Issue 6, p4855
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The interaction of a collisionless beam of thermal C60 nanoclusters with a silicon dioxide surface has been investigated with modulated molecular beam-mass spectroscopic techniques. Analysis of the amplitude and phase lag of the desorbed C60 shows the interaction mechanism to involve the elementary steps of sticking, desorption, and long-range surface diffusion. Surface diffusion coefficients determined in this measurement indicate that surface C60 nanoclusters approach two-dimensional gas-like behavior. The sticking probability of C60 clusters on SiO2 is determined to be unity. The best fit desorption rate constant kd for C60 from SiO2 is 5×1010 exp(-23 kcal/mol/RT) in agreement with previous temperature programmed desorption experiments. The efficiencies of electron impact ionization of C60 to C60+ and C60++ is measured for electron energies from 10 to 105 eV for neutrals at 875 K.
ACCESSION #
7650156

 

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