TITLE

In situ x-ray diffraction studies of YBa2Cu3Ox

AUTHOR(S)
Williams, S.; Zheng, J. Q.; Shih, M. C.; Wang, X. K.; Lee, S. J.; Rippert, E. D.; Maglic, S.; Kajiyama, Hiroshi; Segel, D.; Dutta, P.; Chang, R. P. H.; Ketterson, J. B.; Roberts, T.; Lin, Y.; Kampwirth, R. T.; Gray, K.
PUB. DATE
November 1992
SOURCE
Journal of Applied Physics;11/15/1992, Vol. 72 Issue 10, p4798
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Deals with a study which examined in situ x-ray diffraction studies of the growth of thin films using a synchrotron light source. Information on an off-axis faced magnetron sputtering chamber; Methodology of the study; Results and discussion.
ACCESSION #
7637169

 

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