TITLE

Mode characterization of sub-micron equilateral triangular microcavity including material's dispersion effects

AUTHOR(S)
Lai, C.-M.; Yeh, P. C.; Peng, L.-H.
PUB. DATE
May 2012
SOURCE
Journal of Applied Physics;May2012, Vol. 111 Issue 10, p103111
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We report the study of resonant modes in an equilateral triangular gallium nitride (GaN) microcavity, with the material's dispersion taken into account. From the polarization-resolved photo-luminescence measurements, we observed the resonance of GaN bandedge emission with the cavity modes to be transverse magnetic-polarization active and characterized with a quality factor as high as ∼1000 in a GaN cavity of 0.75 µm side length. Using a finite difference time domain technique, we showed that these observations can be ascribed to the material's dispersion effects. The latter can modify the cavity phase-matching condition, reduce the spectral bandwidth of the corresponding resonant modes and enhance the cavity quality factor by a factor more than three.
ACCESSION #
76273233

 

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