Progress on precision measurements of inner shell transitions in highly charged ions at an ECR ion source

Szabo, Csilla I.; Indelicato, Paul; LeBigot, Eric-Olivier; Vallette, Alexandre; Amaro, Pedro; Guerra, Mauro; Gumberidze, Alex
May 2012
AIP Conference Proceedings;5/25/2012, Vol. 1438 Issue 1, p236
Academic Journal
Inner shell transitions of highly charged ions produced in the plasma of an Electron Cyclotron Resonance Ion Source (ECRIS) [1] were observed the first time by a Double Crystal Spectrometer (DCS). The DCS is a well-used tool in precision x-ray spectroscopy due to its ability of precision wavelength measurement traced back to a relative angle measurement. Because of its requirement for a bright x-ray source the DCS has not been used before in direct measurements of highly charged ions (HCI). Our new precision measurement of inner shell transitions in HCI is not just going to provide new x-ray standards for quantum metrology but can also give information about the plasma in which the ions reside. Ionic temperatures and with that the electron density can be determined by thorough examination of line widths measured with great accuracy.


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