TITLE

Thickness of the damaged layer along the track made by a high-energy ion in polyimide

AUTHOR(S)
Vilenskiı, A. I.; Mchedlishvili, B. V.; Klyuev, V. A.; Toporov, Yu. P.
PUB. DATE
December 1997
SOURCE
Technical Physics Letters;Dec97, Vol. 23 Issue 12, p931
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The thickness of the damaged layer along a particle track in polyimide is estimated by the method of thermally stimulated exoelectron emission and found to be ∼30 nm.
ACCESSION #
7325989

 

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