Photon scanning tunneling microscope with a nonresonance atomic-force regime

Lapshin, D. A.
September 1998
Technical Physics;Sep98, Vol. 43 Issue 9, p1055
Academic Journal
A design of a photon scanning tunneling microscope is presented. The shear-force regime and the advantages of nonresonance excitation of the probe are discussed in detail. It is suggested that the replica method be used to estimate the size of the active part of the probe. © 1998 American Institute of Physics.


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