Simulation of the influence of the tip radius on the sensitivity of an atomic force microscope

Pokropivny─▒, A. V.; Pokropivny─▒, V. V.; Skorokhod, V. V.
December 1997
Technical Physics;Dec97, Vol. 42 Issue 12, p1435
Academic Journal
The atomic-force-microscopic image of an isoforce surface with a defect is obtained for the first time by computer simulation. The dependence of the computer image of a surface pentavacancy on the tip radius is thoroughly investigated. It is shown that the resolving power increases as the tip radius is diminished.


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