Using an atomic force microscope in the surface modification regime to determine the migration energy of surface defects

Blagov, E. V.; Mostepanchenko, V. M.; Klimchitskaya, G. L.
August 1999
Technical Physics;Aug99, Vol. 44 Issue 8, p964
Academic Journal
The lines of constant force and the profiles of the horizontal force component are calculated for the scanning of the tip of an atomic force microscope over a surface vacancy in a close-packed lattice with allowance for atomic displacements. The character of the lines of force is studied in all three scanning regimes that arise for different values of the force: without modification of the surface by the tip, migration of a single vacancy by a single interatomic distance in the direction opposite to the motion of the tip, and “dragging” of a vacancy by the tip. It is shown that the profiles of the horizontal force component can be used to calculate the activation energy for surface migration of a vacancy. An estimate is made of the scanning force for which these effects may be observed experimentally. © 1999 American Institute of Physics.


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