TITLE

High-resolution threshold photoelectron study of the propargyl radical by the vacuum ultraviolet laser velocity-map imaging method

AUTHOR(S)
Gao, Hong; Xu, Yuntao; Yang, Lei; Lam, Chow-Shing; Wang, Hailing; Zhou, Jingang; Ng, C. Y.
PUB. DATE
December 2011
SOURCE
Journal of Chemical Physics;12/14/2011, Vol. 135 Issue 22, p224304
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
By employing the vacuum ultraviolet (VUV) laser velocity-map imaging (VMI) photoelectron scheme to discriminate energetic photoelectrons, we have measured the VUV-VMI-threshold photoelectrons (VUV-VMI-TPE) spectra of propargyl radical [C3H3(X2B1)] near its ionization threshold at photoelectron energy bandwidths of 3 and 7 cm-1 (full-width at half-maximum, FWHM). The simulation of the VUV-VMI-TPE spectra thus obtained, along with the Stark shift correction, has allowed the determination of a precise value 70 156 ± 4 cm-1 (8.6982 ± 0.0005 eV) for the ionization energy (IE) of C3H3. In the present VMI-TPE experiment, the Stark shift correction is determined by comparing the VUV-VMI-TPE and VUV laser pulsed field ionization-photoelectron (VUV-PFI-PE) spectra for the origin band of the photoelectron spectrum of the X+-X transition of chlorobenzene. The fact that the FWHMs for this origin band observed using the VUV-VMI-TPE and VUV-PFI-PE methods are nearly the same indicates that the energy resolutions achieved in the VUV-VMI-TPE and VUV-PFI-PE measurements are comparable. The IE(C3H3) value obtained based on the VUV-VMI-TPE measurement is consistent with the value determined by the VUV laser PIE spectrum of supersonically cooled C3H3(X2B1) radicals, which is also reported in this article.
ACCESSION #
69661023

 

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