Note: Extraction of temperature-dependent interfacial resistance of thermoelectric modules

Chen, Min
November 2011
Review of Scientific Instruments;Nov2011, Vol. 82 Issue 11, p116109
Academic Journal
This article discusses an approach for extracting the temperature dependency of the electrical interfacial resistance associated with thermoelectric devices. The method combines a traditional module-level test rig and a nonlinear numerical model of thermoelectricity to minimize measurement errors on the interfacial resistance. The extracted results represent useful data to investigating the characteristics of thermoelectric module resistance and comparing performance of various modules.


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