TITLE

Diagnostics of nanostructured states of materials after strong external exposures by atom probe methods of field ion microscopy

AUTHOR(S)
Ivchenko, V.
PUB. DATE
December 2011
SOURCE
Inorganic Materials;Dec2011, Vol. 47 Issue 15, p1655
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Modifications of the structure of metal materials after strong external exposures are studied in the nanometer range using field ion microscopy (FIM) and FIM atom probes. The essence of the method, device operation principle, and experimental techniques are briefly characterized. The possibility of three-dimensional reconstruction of the elemental composition of studied materials with atomic resolution is shown by original results.
ACCESSION #
67508793

 

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics