TITLE

Note: Mechanical and electrical characterization of nanowires in scanning electron microscope

AUTHOR(S)
Ru, Changhai; Sun, Lining
PUB. DATE
October 2011
SOURCE
Review of Scientific Instruments;Oct2011, Vol. 82 Issue 10, p106105
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
This note presents two experimental techniques for mechanical and electrical characterization of individual nanowires inside a scanning electron microscope (SEM). Tensile testing is realized by transferring a nanowire to a microelectromechanical systems device that stretches the nanowire and measures the elongations and tensile forces. The device consists of an electrostatic actuator and two capacitive sensors, capable of acquiring all measurement data (force and displacement) electronically without relying on electron microscopy imaging. For electrical characterization, four-point probe measurement of individual nanowires is performed automatically by controlling four nanomanipulators with SEM visual feedback. A feedforward controller is incorporated into the control system to improve the response time. This work represents advances in nanomaterial testing and automated nanomanipulation.
ACCESSION #
66903105

 

Related Articles

  • In situ mechanical testing of templated carbon nanotubes. Lu, Shaoning; Guo, Zaoyang; Ding, Weiqiang; Dikin, Dmitriy A.; Lee, Junghoon; Ruoff, Rodney S. // Review of Scientific Instruments;Dec2006, Vol. 77 Issue 12, p125101 

    A new microelectromechanical system (MEMS)-based tensile testing stage (with integrated actuator, direct load sensing beam, and electrodes for controlled assembly of an individual nanostructure) was developed and used for in situ tensile loading of a templated carbon nanotube (T-CNT) inside a...

  • Synthesies and properties of Tb-doped GaN nanowires. Cao, Y. P.; Shi, F.; Xiu, X. W.; Sun, H. B.; Guo, Y. F.; Liu, W. J.; Xue, C. S. // Inorganic Materials;Oct2010, Vol. 46 Issue 10, p1096 

    The synthesis of Tb-doped GaN nanowires on Si (111) substrates through ammoniating GaO films doped with Tb was investigated. X-ray photoelectron spectroscopy, X-ray diffraction, scanning electron microscope, high-resolution transmission electron microscopy and photoluminescence were used to...

  • Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000. M. Sutton; N. Li; D. Joy; A. Reynolds; X. Li // Experimental Mechanics;Dec2007, Vol. 47 Issue 6, p775 

    Abstract  A series of baseline displacement measurements have been obtained using 2D Digital Image Correlation (2D-DIC) and images from Scanning Electron Microscopes (SEM). Direct correlation of subsets from a reference image to subsets in a series of uncorrected images is used to identify...

  • Fabrication of metallic nanowires with a scanning tunneling microscope. Kramer, N.; Birk, H. // Applied Physics Letters;3/13/1995, Vol. 66 Issue 11, p13253 

    Introduces the fabrication of metallic semiconductors in a probing microscope. Advantages of hydrogenated amorphous silicon; Stability of hydrogenated amorphous silicon against oxidation in air; Demonstration of the potentiality of thin films by fabrication of metallic nanowires.

  • Electromigration in Gold and Single Crystalline Silver Nanowires. Stahlmecke, B.; Chelaru, L. I.; zu Heringdorf, F.-J. Meyer; Dumpich, G. // AIP Conference Proceedings;2006, Vol. 817 Issue 1, p65 

    We studied electromigration in polycrystalline gold and single crystalline silver nanowires. The gold wires are prepared using a two step electron beam lithography process. The silver wires grow self organized and epitaxially along step edges on Si (001) substrates and have a typical width of...

  • Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000. M. Sutton; N. Li; D. Garcia; N. Cornille; J. Orteu; S. McNeill; H. Schreier; X. Li; A. Reynolds // Experimental Mechanics;Dec2007, Vol. 47 Issue 6, p789 

    Abstract  A combination of drift distortion removal and spatial distortion removal are performed to correct Scanning Electron Microscope (SEM) images at both �200 and �10,000 magnification. Using multiple, time-spaced images and in-plane rigid body motions to extract the relative...

  • World's Smallest Universal Material Testing System. Geiger, Greg // American Ceramic Society Bulletin;Nov2005, Vol. 84 Issue 11, p4 

    The article reports that researchers at Northwestern University in Evanston, Illinois have designed and built a complete micromachine that makes possible the study of nanomechanics phenomena in real time. The machine has the ability to fit into tiny spaces as required by in-situ transmission...

  • Add-on transmission attachments for the scanning electron microscope. Khursheed, A.; Karuppiah, N.; Osterberg, M.; Thong, J. T. L. // Review of Scientific Instruments;Jan2003, Vol. 74 Issue 1, p134 

    This article presents simulation and experimental results for add-on transmission attachments that have been developed for the scanning electron microscope (SEM). A primary beam energy of around 30 keV is used to irradiate thin test specimens (<100 nm). A transmission lens attachment enables a...

  • Decoding the SEM alphabet soup. Griffith, Edward // R&D Magazine;Apr99, Vol. 41 Issue 5, p41 

    Details a class of scanning electronic microscope (SEM) techniques in which more than one SEM operating mode is possible. Acronyms used to denote the SEM class; Applications of a gas-mode SEM; High-vacuum imaging techniques.

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics