The development of the superconducting phase and the origin of potential current limiting defects in Bi-2223 tapes

Holesinger, T. G.; Bingert, J. F.; Parrella, R. D.; Riley, G. N.
May 2002
AIP Conference Proceedings;2002, Vol. 614 Issue 1, p724
Academic Journal
Controlling phase development and optimizing grain-to-grain connectivity are the primary issues that affect the performance of (Bi,Pb)[sub 2]Sr[sub 2]Ca[sub 2]Cu[sub 3]O[sub 10-x] (Bi-2223) multifilamentary tapes. Analytical electron microscopy was used to identify defects in these tapes that were either structural, compositional, or a combination of the two. Defects are introduced into the filament microstructure either intrinsically through the normal evolution of phases or extrinsically by various aspects of the thermo-mechanical processing. Relationships between connectivity and microstructure are discussed in light of the present understanding of current transport in Bi-2223 tapes.


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