TITLE

Thin film alloy mixtures for high speed phase change optical storage: A study on (Ge[sub 1]Sb[sub 2]Te[sub 4])[sub 1-x](Sn[sub 1]Bi[sub 2]Te[sub 4])[sub x]

AUTHOR(S)

Lee, Tae-Yon; Kim, Ki-Bum; Cheong, Byung-ki; Lee, Taek Sung; Park, Sung Jin; Lee, Kyeong Seok; Kim, Won Mok; Kim, Soon Gwang

PUB. DATE

May 2002

SOURCE

Applied Physics Letters;5/6/2002, Vol. 80 Issue 18, p3313

SOURCE TYPE

Academic Journal

DOC. TYPE

Article

ABSTRACT

An approach is proposed to develop recording materials for high speed phase change optical data storage. It utilizes a thin film alloy mixture between a stoichiometric GeSbTe alloy and an additive ternary telluride alloy. Selection rules for an additive alloy are suggested. For a test, (Ge[sub 1]Sb[sub 2]Te[sub 4])[sub 1-x](Sn[sub 1]Bi[sub 2]Te[sub 4])[sub x] thin films are deposited by co-sputtering and their structural and thermal properties are studied. Ge[sub 1]Sb[sub 2]Te[sub 4] and Sn[sub 1]Bi[sub 2]Te[sub 4] are found to form a completely soluble pseudo-binary system, whose crystalline lattice parameters obey Vegard's rule over the entire range of x (0

ACCESSION #

6579248

 

Related Articles

• TeSeF films by TeSe-SeF6/Ar reactive sputtering for ablative optical recording. Horie, Michikazu; Tamura, Takanori; Ohgaki, Mitsuaki; Yoshida, Hidemi; Kisaka, Yoshiyuki; Kobayashi, Yoshimitsu // Journal of Applied Physics;3/1/1994, Vol. 75 Issue 5, p2680 

  Studies the tellurium compound thin films prepared by ractive sputtering for ablative optical recording. Commercialization of ablative write-once optical storage media; Details on the experiment; Discussion on the results of the study.

• Photoinduced hysteresis changes and optical storage in (Pb,La)(Zr,Ti)O3 thin films and ceramics. Dimos, D.; Warren, W. L.; Sinclair, M. B.; Tuttle, B. A.; Schwartz, R. W. // Journal of Applied Physics;10/1/1994, Vol. 76 Issue 7, p4305 

  Focuses on a study which examined photoinduced hysteresis changes and optical storage in (Pb,La)(Zr,Ti))[sub3] thin films and ceramics. Types that thin films and bulk ceramics exhibit in their hystreresis behavior; Cause of the voltage-shift effect; Implication of the thickness dependence of...

• Optical poling and its application in optical storage of a polyimide film with high glass transition temperature. Si, Jinhai; Mitsuyu, Tsuneo; Ye, Peixian; Shen, Yequan; Hirao, Kazuyuki // Applied Physics Letters;2/16/1998, Vol. 72 Issue 7 

  The temperature dependence of optical poling of a side-chain azobenzene–polyimide film with high glass transition temperature was experimentally investigated. With the increase of the sample temperature the light-induced second-harmonic generation increased first, and then decreased as...

• Reversible phase-change optical data storage in InSbTe alloy films. Maeda, Yoshihito; Andoh, Hisashi; Ikuta, Isao; Minemura, Hiroyuki // Journal of Applied Physics;8/15/1988, Vol. 64 Issue 4, p1715 

  Presents a study on the reversible phase-change optical data storage in InSbTe alloy films. Observation of the reversible phase-change; Results; Conclusion.

• Finite element analysis of thermal stresses in optical storage media. Evans, K. E.; Nkansah, M. A.; Abbott, S. J. // Journal of Applied Physics;10/1/1988, Vol. 64 Issue 7, p3398 

  Discusses a study which examined the use of finite element techniques to calculate the thermal stresses generated in single-layer, optical storage thin films. Prediction in the calculations made; Factors that are considered with either air or substrate incident laser sources; Reason for the use...

• Effect of indium doping on Ge2Sb2Te5 thin films for phase-change optical storage. Wang, K.; Steimer, C.; Wamwangi, D.; Ziegler, S.; Wuttig, M. // Applied Physics A: Materials Science & Processing;May2005, Vol. 80 Issue 8, p1611 

  The influence of In doping on the crystallization kinetics of Ge2Sb2Te5 has been investigated using four-point-probe electrical resistance measurements, grazing incidence X-ray diffraction (XRD), X-ray reflectometry (XRR), variable incident angle spectroscopic ellipsometry, a static tester, and...

• ViewSonic VP191s. Dawson, Stephen // Australian Personal Computer;Jan2005, Vol. 25 Issue 1, p60 

  This article presents information on ViewSonic's VP191s computer monitor. Unusually, the VP191s has three inputs — two analogue VGA and the DVI — which give it tremendous flexibility but make for a slower startup as the monitor cycles through the inputs looking for a valid signal....

• The Effect of Optical Radiation on the Semiconductor Conductivity in a Thin-Film Ferroelectric–Semiconductor Structure. Afanas'ev, V. P.; Bulat, D. Yu.; Kaptelov, E. Yu.; Pronin, I. P. // Technical Physics Letters;Jun2004, Vol. 30 Issue 6, p518 

  We have studied the effect of optical radiation on the conductivity of a thin-film field-effect transistor based on a multilayer structure of the Si–SiO2–Pt–PZT–SnO2 – x–Pt type. Within the permissible radiation dose, the conducting channel exhibits a...

• Effect of constituent phases of reactively sputtered AgOx film on recording and readout mechanisms of super-resolution near-field structure disk. Yung-Chiun Her; Yuh-Chang Lan; Wei-Chih Hsu; Song-Yeu Tsai // Journal of Applied Physics;8/1/2004, Vol. 96 Issue 3, p1283 

  We have studied the dependence of the constituent phases of reactively sputtered AgOx mask layer on the recording and readout mechanisms of super-resolution near-field disk. At low oxygen flow ratios, the AgOx mask layer was found to be composed of an appreciable amount of Ag particles with...