Resonant tunneling through metal (Ag–Ti)/insulator (MgO) triple barrier structures

Kado, T.
May 2002
Applied Physics Letters;5/6/2002, Vol. 80 Issue 18, p3382
Academic Journal
Resonant tunneling through metal (Ag-Ti)/insulator (MgO) triple barrier structures has been demonstrated. The multilayers with the triple barrier structures were epitaxially grown on MgO (001) substrates under 473 K by the electron beam evaporation method. For the measurement of current-voltage characteristics, the mesa-isolated diodes were fabricated by photolithography. The observed current peaks in the current-voltage characteristics of the diodes could be explained as the resonant tunneling current.


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