A time-of-flight backscattering spectrometer at the Spallation Neutron Source, BASIS

Mamontov, E.; Herwig, K. W.
August 2011
Review of Scientific Instruments;Aug2011, Vol. 82 Issue 8, p085109
Academic Journal
We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer installed at a spallation neutron source. In addition to high intensity, it offers a high-energy resolution of about 3.5 μeV and a large and variable energy transfer range. These ensure an excellent overlap with the dynamic ranges accessible at other inelastic spectrometers at the SNS.


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