Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization

Zhang, Lan; Ju, Yang; Hosoi, Atsushi; Fujimoto, Akifumi
December 2010
Review of Scientific Instruments;Dec2010, Vol. 81 Issue 12, p123708
Academic Journal
We introduce a new type of microscopy which is capable of investigating surface topography and electrical property of conductive and dielectric materials simultaneously on a nanometer scale. The microwave atomic force microscopy is a combination of the principles of the scanning probe microscope and the microwave-measurement technique. As a result, under the noncontact AFM working conditions, we successfully generated a microwave image of a 200-nm Au film coating on a glass wafer substrate with a spatial resolution of 120 nm and a measured voltage difference of 19.2 mV between the two materials.


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