TITLE

Spectroscopic ellipsometry for characterization of InAs/Ga1-xInxSb superlattices

AUTHOR(S)
Wagner, J.; Schmitz, J.; Herres, N.; Fuchs, F.; Walther, M.
PUB. DATE
May 1998
SOURCE
Journal of Applied Physics;5/15/1998, Vol. 83 Issue 10, p5452
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Provides information on an experiment measuring the pseudodielectric function of InAs/Ga1-xInxSb superlattices (SLs) grown by solid-source molecular-beam epitaxy. Methodology used to conduct the experiment; Indepth look at spectroscopic ellipsometry (SE); Results of study.
ACCESSION #
649030

 

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