TITLE

Auger Electron Spectroscopy (AES) and Sputter Depth Profiling for Characterization of Metal Substrates and Pretreatment Coatings

AUTHOR(S)
Simko, Steven J.
PUB. DATE
March 2011
SOURCE
CoatingsTech;Mar2011, Vol. 8 Issue 3, p52
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The article discusses the significance of Auger electron spectroscopy (AES) and sputter depth profiling in coating processes. An overview of the process for generating AES, a surface sensitive analysis method for determining the elemental composition of solid materials, which is an extremely useful tool in the coating processes. It also notes the used of sputter depth profiling in enhancing the characterization capability of AES through providing spatially resolve chemical information.
ACCESSION #
64433279

 

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