Performing current versus voltage measurements of single-walled carbon nanotubes using scanning force microscopy

de Pablo, P.J.; Gómez-Navarro, C.; Martinez, M.T.; Benito, A.M.; Maser, W.K.; Colchero, J.; Gómez-Herrero, J.; Baró, A.M.
February 2002
Applied Physics Letters;2/25/2002, Vol. 80 Issue 8, p1462
Academic Journal
Presents a method to perform current versus voltage measurements of single-walled carbon nanotubes (SWNT) using scanning force microscopy. Application of the method to check the ballistic transport of SWNT; Effects of applying stresses to a SWNT; Impact to the electrical properties of SWNT.


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