Self-navigation of a scanning tunneling microscope tip toward a micron-sized graphene sample

Li, Guohong; Luican, Adina; Andrei, Eva Y.
July 2011
Review of Scientific Instruments;Jul2011, Vol. 82 Issue 7, p073701
Academic Journal
We demonstrate a simple capacitance-based method to quickly and efficiently locate micron-sized conductive samples, such as graphene flakes, on insulating substrates in a scanning tunneling microscope (STM). By using edge recognition, the method is designed to locate and to identify small features when the STM tip is far above the surface, allowing for crash-free search and navigation. The method can be implemented in any STM environment, even at low temperatures and in strong magnetic field, with minimal or no hardware modifications.


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