Wideband phase-locked loop circuit with real-time phase correction for frequency modulation atomic force microscopy

Fukuma, Takeshi; Yoshioka, Shunsuke; Asakawa, Hitoshi
July 2011
Review of Scientific Instruments;Jul2011, Vol. 82 Issue 7, p073707
Academic Journal
We have developed a wideband phase-locked loop (PLL) circuit with real-time phase correction for high-speed and accurate force measurements by frequency modulation atomic force microscopy (FM-AFM) in liquid. A high-speed operation of FM-AFM requires the use of a high frequency cantilever which, however, increases frequency-dependent phase delay caused by the signal delay within the cantilever excitation loop. Such phase delay leads to an error in the force measurements by FM-AFM especially with a low Q factor. Here, we present a method to compensate this phase delay in real time. Combined with a wideband PLL using a subtraction-based phase comparator, the method allows to perform an accurate and high-speed force measurement by FM-AFM. We demonstrate the improved performance by applying the developed PLL to three-dimensional force measurements at a mica/water interface.


Related Articles

  • Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Rode, S.; Stark, R.; Lübbe, J.; Tröger, L.; Schütte, J.; Umeda, K.; Kobayashi, K.; Yamada, H.; Kühnle, A. // Review of Scientific Instruments;Jul2011, Vol. 82 Issue 7, p073703 

    A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force...

  • Wideband digital frequency detector with subtraction-based phase comparator for frequency modulation atomic force microscopy. Mitani, Yuji; Kubo, Mamoru; Muramoto, Ken-ichiro; Fukuma, Takeshi // Review of Scientific Instruments;Aug2009, Vol. 80 Issue 8, p083705 

    We have developed a wideband digital frequency detector for high-speed frequency modulation atomic force microscopy (FM-AFM). We used a subtraction-based phase comparator (PC) in a phase-locked loop circuit instead of a commonly used multiplication-based PC, which has enhanced the detection...

  • A Novel CAF Based on Multirate Signal Processing and Envelope Shift Compensation. Yuan Feng; Tao Shan; Zhihai Zhuo // International Proceedings of Computer Science & Information Tech;2012, Vol. 41, p71 

    Passive radar can be used for aircraft surveillance, the principle of which is achieving energy integration of the moving target echo with the help of Cross Ambiguity Function (CAF). In this paper we present a new calculation method of CAF based on multirate signal processing and envelope shift...

  • Simulation of the Integrated Signal Folding Circuit with P--Spice. Jasonis, V.; Poviliauskas, D.; Marcinkevičius, A. // Electronics & Electrical Engineering;2007, Issue 73, p37 

    The dynamical characteristics simulation results of the analog signal folding circuit for comparator ADCs were presented. The transient processes at differential folding and comparator stages switching points were simulated using improved models of real transistors and software P - Spice, when...

  • Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry. Tong Guo; Siming Wang; Dorantes-Gonzalez, Dante J.; Jinping Chen; Xing Fu; Xiaotang Hu // Sensors (14248220);2012, Vol. 12 Issue 1, p175 

    A hybrid atomic force microscopic (AFM) measurement system combined with white light scanning interferometry for micro/nanometer dimensional measurement is developed. The system is based on a high precision large-range positioning platform with nanometer accuracy on which a white light scanning...

  • Frequency modulation atomic force microscopy in ambient environments utilizing robust feedback tuning. Kilpatrick, J. I.; Gannepalli, A.; Cleveland, J. P.; Jarvis, S. P. // Review of Scientific Instruments;Feb2009, Vol. 80 Issue 2, pN.PAG 

    Frequency modulation atomic force microscopy (FM-AFM) is rapidly evolving as the technique of choice in the pursuit of high resolution imaging of biological samples in ambient environments. The enhanced stability afforded by this dynamic AFM mode combined with quantitative analysis enables the...

  • Nanoscale potential measurements in liquid by frequency modulation atomic force microscopy. Kobayashi, Naritaka; Asakawa, Hitoshi; Fukuma, Takeshi // Review of Scientific Instruments;Dec2010, Vol. 81 Issue 12, p123705 

    We have developed a method for local potential measurements in liquid using frequency modulation atomic force microscopy. In this method, local potential is calculated from the first and second harmonic vibrations of a cantilever induced by applying an ac bias voltage between a tip and a sample....

  • Dynamic force spectroscopy using cantilever higher flexural modes. Sugimoto, Yoshiaki; Innami, Seiji; Abe, Masayuki; Custance, Óscar; Morita, Seizo // Applied Physics Letters;8/27/2007, Vol. 91 Issue 9, p093120 

    By means of force spectroscopy measurements performed with the cantilever first and second flexural modes under the frequency modulation detection method, the authors corroborate the validity of the relation between tip-surface interaction force and frequency shift for force spectroscopy...

  • Local contact potential difference of molecular self-assemblies investigated by Kelvin probe force microscopy. Spadafora, Evan J.; Linares, Mathieu; Nisa Yahya, Wan Zaireen; Lincker, Frédéric; Demadrille, Renaud; Grevin, Benjamin // Applied Physics Letters;12/5/2011, Vol. 99 Issue 23, p233102 

    Self-assembled pi-conjugated oligomer nanowires have been investigated by frequency modulation atomic force microscopy and amplitude modulation Kelvin probe force microscopy under ultra high vacuum. The distance dependence of the contact potential difference (CPD) has been analyzed by combining...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics