Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes

Larsen, T.; Moloni, K.; Flack, F.; Eriksson, M. A.; Lagally, M. G.; Black, C. T.
March 2002
Applied Physics Letters;3/18/2002, Vol. 80 Issue 11, p1996
Academic Journal
The resolution and wear properties of carbon nanotube and etched-silicon atomic force microscopy probes are compared in intermittent-contact mode. Carbon nanotube probes have at least 20 times the life of etched-silicon probes and provide better resolution at all stages. Sample wear is minimized with carbon nanotube probes.


Related Articles

  • Single-wall carbon nanotube atomic force microscope probes. Snow, E. S.; Campbell, P. M.; Novak, J. P. // Applied Physics Letters;3/18/2002, Vol. 80 Issue 11, p2002 

    We examine the factors that govern the stability of imaging using single-wall C nanotubes as probes for atomic force microscopy. Nonvertical alignment of the nanotubes causes such probes to bend in response to the surface-nanotube interaction forces during imaging. For long nanotubes, this...

  • Local current density detection of individual single-wall carbon nanotubes in a bundle. Fujiwara, Akihiko; Iijima, Ryosuke; Ishii, Kenji; Suematsu, Hiroyoshi; Kataura, Hiromichi; Maniwa, Yutaka; Suzuki, Shinzo; Achiba, Yohji // Applied Physics Letters;3/18/2002, Vol. 80 Issue 11, p1993 

    We have measured the local current density on individual single-wall carbon nanotubes (SWNTs) with the conducting tip of an atomic force microscope; the SWNTs make up a nanometer-scale electronic circuit on an insulating substrate. Scanning tunneling spectroscopy measurements at certain...

  • Nanotubes and force interactions in an atomic force microscope. Dedkov, G. V.; Rekhviashvili, S. Sh. // Technical Physics;Aug99, Vol. 44 Issue 8, p982 

    The conditions for nanotubes to be used as atomic force microscope (AFM) probes are analyzed. It is shown theoretically for the first time that single- and multilayer tubes with diameters ranging from 0.5 to 5 nm give atomic-level resolution of the surface. The presence of cylindrical symmetry...

  • Wafer scale production of carbon nanotube scanning probe tips for atomic force microscopy. Yenilmez, Erhan; Wang, Qian; Chen, Robert J.; Wang, Dunwei; Dai, Hongjie // Applied Physics Letters;3/25/2002, Vol. 80 Issue 12, p2225 

    A methodology is developed to enable wafer scale fabrication of single-walled carbon nanotube (SWNT) tips for atomic force microscopy. Catalyst selectively placed onto 375 prefabricated Si tips on a wafer is made possible by a simple patterning technique. Chemical vapor deposition on the wafer...

  • Cross talk between friction and height signals in atomic force microscopy. Piner, Richard; Ruoff, Rodney S. // Review of Scientific Instruments;Sep2002, Vol. 73 Issue 9, p3392 

    Atomic force and lateral force microscopes use a four quadrant p-i-n detector to measure the motion of a laser beam reflected from the top of a cantilever. If the detector is rotated slightly in the plane of the p-i-n diode, this will cause frictional forces to be detected as a false height...

  • Locally measured electronic properties of single wall carbon nanotubes. Freitag, M.; Johnson, A. T. // AIP Conference Proceedings;2000, Vol. 544 Issue 1, p355 

    We use a conducting-tip atomic force microscope (CT-AFM) to measure the local electronic properties of single wall carbon nanotube (SWNT) circuits. Tunnel current images of SWNTs in circuits can have 1 nm resolution, much better than that of standard AFM. By using the tip as a mobile electrode,...

  • Electrical cutting and nicking of carbon nanotubes using an atomic force microscope. Park, Ji-Yong; Yaish, Yuval; Brink, Markus; Rosenblatt, Sami; McEuen, Paul L. // Applied Physics Letters;6/10/2002, Vol. 80 Issue 23, p4446 

    An atomic force microscope (AFM) has been used to modify the electrical properties of carbon nanotube devices. By applying voltage pulses from a metal-coated AFM tip, electrical breaks ("cuts") or tunneling barriers ("nicks") can be created at any point along a tube. These methods are applied to...

  • Atomic force microscopy observation of insulated molecular wire formed by conducting polymer and molecular nanotube. Shimomura, Takeshi; Akai, Tomonori; Abe, Takumi; Ito, Kohzo // Journal of Chemical Physics;2/1/2002, Vol. 116 Issue 5, p1753 

    Inclusion complex formation between a conducting polymer, polyaniline (PANI) with emeraldine base, and a molecular nanotube synthesized from α-cyclodextrin (α-CD) has been studied by atomic force microscopy. We observed a rodlike inclusion complex of PANI and the molecular nanotube on mica...

  • Point-contact current-imaging atomic force microscopy: Measurement of contact resistance between single-walled carbon nanotubes in a bundle. Otsuka, Yoichi; Naitoh, Yasuhisa; Matsumoto, Takuya; Kawai, Tomoji // Applied Physics Letters;3/24/2003, Vol. 82 Issue 12, p1944 

    Conductance of bundled single-walled carbon nanotubes (b-SWCNTs) are measured by point-contact current-imaging atomic force microscopy (PCI-AFM). Simultaneous mapping of the topographic information and current through SWCNTs enable us to investigate the relationship between structure and...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics