Single-wall carbon nanotube atomic force microscope probes

Snow, E. S.; Campbell, P. M.; Novak, J. P.
March 2002
Applied Physics Letters;3/18/2002, Vol. 80 Issue 11, p2002
Academic Journal
We examine the factors that govern the stability of imaging using single-wall C nanotubes as probes for atomic force microscopy. Nonvertical alignment of the nanotubes causes such probes to bend in response to the surface-nanotube interaction forces during imaging. For long nanotubes, this elastic response causes the nanotube tip to jump into contact with the surface and renders it unsuitable for imaging. For short nanotubes, stable noncontact-mode imaging can be achieved using a small cantilever vibration amplitude. However, the bending response is enhanced on highly textured surfaces, which limits the ability to image nonplanar features.


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