Soft x-ray and Auger electron spectroscopy of single and double electron capture processes in slow Nee++He collisions

Bliman, S.; Cornille, M.; Langerels, A.; Nordgren, J.; Bruch, R.; Phaneuf, R.; Swenson, J.; Schneider, D.
January 1997
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p1080
Academic Journal
Discusses the results of high resolution extreme ultraviolet photon and Auger electron measurements to elucidate single and double capture processes in Ne[sup 8+]+He single collisions at 80 keV impact energy. Atomic structure calculations; Collision dynamics and analysis; Conclusions that can be drawn from the comparison of the photon and electron spectra.


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