Very high, resolution soft x-ray spectrometer for an electron beam ion trap

Beiersdorfer, P.; Lopez-Urrutia, J. R. Crespo; Forster, E.; Mahiri, J.; Widmann, K.
January 1997
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p1077
Academic Journal
Describes the construction of a very high resolution vacuum flat-crystal spectrometer for analyzing soft x rays emitted by an electron beam ion trap. Spectrometer design; Performance and spectral measurements.


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