TITLE

How to beat the low resolution of multilayer mirror spectra (invited)

AUTHOR(S)
Regan, S. P.; Fournier, K. B.; May, M. J.; Soukhanovskii, V.; Finkenthal, M.; Moos, H. W.
PUB. DATE
January 1997
SOURCE
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p1002
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Illustrates how atomic physics modeling can be used to extract the soft x-ray and extreme ultraviolet (XUV) spectral line brightnesses measured with low-resolution, high-photon-throughput, multilayer mirror (MLM)-based devices. Overview of MLM-based devices; XUV radiation of low Z impurities; L-shell emission of intermediate Z impurities.
ACCESSION #
630904

 

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