How to beat the low resolution of multilayer mirror spectra (invited)

Regan, S. P.; Fournier, K. B.; May, M. J.; Soukhanovskii, V.; Finkenthal, M.; Moos, H. W.
January 1997
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p1002
Academic Journal
Illustrates how atomic physics modeling can be used to extract the soft x-ray and extreme ultraviolet (XUV) spectral line brightnesses measured with low-resolution, high-photon-throughput, multilayer mirror (MLM)-based devices. Overview of MLM-based devices; XUV radiation of low Z impurities; L-shell emission of intermediate Z impurities.


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