Edge density profile measurements in TdeV using amplitude modulation reflectometry

Pinsonneault, D.; Quirion, B.; Lachambre, J.-L.; Legros, C.
January 1997
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p990
Academic Journal
Describes the development of a single channel amplitude modulation reflectometer to provide edge electron density profiles on the TdeV tokamak. Principle; Plasma conditions during the reflectometry experiments; Inversion procedure.


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