Thomson scattering measurements in the RFX reversed field pinch

Bassan, M.; Bilato, R.; Giudicotti, L.; Pasqualotto, R.; Sardella, A.
January 1997
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p718
Academic Journal
Reports on the first systematic measurements of the electron temperature spatial profile in the reversed field pinch experiment RFX using a single pulse Thomson scattering diagnostic. Design of the diagnostic; Electron temperature profiles; Improved detection electronics and profile measurements.


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