TITLE

Thomson scattering measurements in the RFX reversed field pinch

AUTHOR(S)
Bassan, M.; Bilato, R.; Giudicotti, L.; Pasqualotto, R.; Sardella, A.
PUB. DATE
January 1997
SOURCE
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p718
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Reports on the first systematic measurements of the electron temperature spatial profile in the reversed field pinch experiment RFX using a single pulse Thomson scattering diagnostic. Design of the diagnostic; Electron temperature profiles; Improved detection electronics and profile measurements.
ACCESSION #
630825

 

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