Development of a fast solid-state high-resolution density profile reflectometer system on the DIII-D tokamak

Kim, K. W.; Doyle, E. J.; Rhodes, L.; Peebles, W. A.; Rettig, C. L.; Luhmann, Jr., N. C.
January 1997
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p466
Academic Journal
Describes the implementation of a highly reliable density profile reflectometer system on the DIII-D tokamak via fast-sweep broadband frequency-modulated reflectometry. Density profile measurements; Signal quality variations with changing frequency sweep rates; Planned improvements to the system.


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